박람회명 : 동경 표면기술 / 나노테크 / 인쇄전자 박람회 ( NANO TECH 2013 )

개최기간 : 2013년 1월 30일 (수) ~ 2013년 2월 1일 (금)

개최장소 :Tokyo Big sight

개최규모 : 19업체 참가 / 33,756명 참관

홈페이지 : www.nanotechexpo.jp

전시품목

1. Process Technology / Device
Inkjet, Nano Imprint, Dispenser, Laser Aberration, Laser Transcription, Gravure Printing (includes gravure offset printing), Screen Printing (includes rotary screen printing), Flexo Printing, Transcription Printing, Roll to Roll Pattern Formation, Photolithography, Microscopic Pattern Photolithography Device, Coating Technique (wet coat process, dry coat process such as distillation/spattering, spot coating), Dry/Stiffen/Baking Device, (UV rays, electron beam, and far-infrared radiation), Heat Laminate Device, Device Related to Surface Treatment

 

2. Material
Electroconductive Material, Semiconductor Material, Dielectric Material, Nonconductive Material, Metallic Nano Particle, Oxide Semiconductor, Electroconductive Ink, Nonconductive Ink, Inkjet Ink, Metallic Colloid, Organic EL, Color Filter, Board for distribution, Encapsulation Material, Barrier Material, Flexible Substrate, Transparent Electroconductive Film, Functional Film, Optical Stiffened Material, Photoelectric Conversion Material, Photocatalyst

 

3. Device & Component
Organic TFT, Organic EL, Inorganic Electronic luminescence, LCD, Electrocataphoresis, Electronic Paper, Wearable Display, POP Display, Solar Battery, Fuel Cell, Capacitor, Lighting, Sensor, Flexible Speaker, Flexible Actuator, Antenna Module, Smart Packaging, Thin-Film Transistor, Organic Transistor, FPC, Passive Built-in Substrate, Ceramic Condenser, Optical Circuit/Optical Communication Device, Interconnect, RFID, Printed Memory, Printed Tag, Electromagnetic Shield Film, Modulated Light Control Film, Smart Label

 

4. Measurement / Evaluation / Analysis Device
Surface Defect Examination Device, Film Thickness Meter, Film Defect Examination Device, Contact Angle Measurement Device, Various Electronic Microscope, Transmissivity Measurement Device, Film Thickness Unevenness Analysis Device, Organic EL Brightness Evaluation System, Phase Difference Weighing Device, Polarization Device, Brightness Measurement Device, Illuminance Measurement Device, Chromaticity Measurement Device, Ritadation Measurement Device, Spectroscopic Ellipsometer, Spectroscopic Interference Film Thickness Measurement Device

동경 표면기술 / 나노테크 / 인쇄전자 박람회 전시장 전경

이미지 출처 : 동경 표면기술/나노테크/인쇄전자 박람회 홈페이지 ( www.nanotechexpo.jp )